Title :
Modeling and Experimental Verification of the Dynamic Interaction of an AFM-Tip With a Photonic Crystal Microcavity
Author :
Hopman, Wico C L ; van der Werf, Kees O. ; Hollink, Anton J F ; Bogaerts, Wim ; Subramaniam, Vinod ; De Ridder, René M.
Author_Institution :
MESA+ Inst. for Nanotechnol., Univ. of Twente, Enschede, Netherlands
Abstract :
We present a transmission model for estimating the effect of the atomic-force microscopy tapping tip height on a photonic crystal microcavity (MC). This model uses a fit of the measured tip-height-dependent transmission above a ¿hot spot¿ in the MC. The predicted transmission versus average tapping height is in good agreement with the values obtained from tapping mode experiments. Furthermore, we show that for the existing, nonoptimized structure, the transmission coefficient can be tuned between 0.32 and 0.8 by varying the average tapping height from 26 to 265 nm. A transmission larger than that of the undisturbed cavity at resonance was observed at specific tip locations just outside the cavity-terminating holes.
Keywords :
atomic force microscopy; cavity resonators; integrated optics; light transmission; micro-optics; microcavities; optical resonators; photonic crystals; AFM; atomic-force microscopy; cavity-terminating holes; hot spot; integrated optics; optical resonators; photonic crystal microcavity; tapping tip height; transmission coefficient; transmission model; Atomic force microscopy; Microcavities; Nonlinear optics; Optical microscopy; Optical sensors; Optical surface waves; Photonic crystals; Predictive models; Resonance; Scanning electron microscopy; Atomic-force microscopy (AFM); integrated optics; modeling; near-field microscopy; optical microcavities (MCs); optical variables measurement; photonic crystal (PhC);
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2007.911519
