DocumentCode :
1009111
Title :
Tunneling and interface structure of oxidized metal barriers on A15 superconductors
Author :
Talvacchio, J. ; Braginski, A.I. ; Janocko, M.A. ; Bending, S.J.
Author_Institution :
Westinghouse R&D Center, Pittsburgh, PA
Volume :
21
Issue :
2
fYear :
1985
fDate :
3/1/1985 12:00:00 AM
Firstpage :
521
Lastpage :
524
Abstract :
Al5-based tunnel junctions have been prepared with barriers of oxidized Al; Si, and Y. Properties of the superconductor/barrier interface which are crucial for low-leakage junctions were established by correlating XPS spectra of oxidized bilayers and RHEED patterns of the surface of each layer with tunneling characteristics. Comparisons were made between oxidized Al barrier properties for Nb and Nb3Sn base electrodes. Some differences between evaporated and dc magnetron sputtered barriers have emerged.
Keywords :
Magnetic films/devices; Tunnel effect; Atomic layer deposition; Electrodes; High temperature superconductors; Laboratories; Niobium; Niobium-tin; Research and development; Superconducting magnets; Superconductivity; Tunneling;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1985.1063720
Filename :
1063720
Link To Document :
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