Practical DC SQUIDs with extremely low 1/f noise

Author

Tesche, C.D. ; Brown, K.H. ; Callegari, A.C. ; Chen, M.M. ; Greiner, J.H. ; Jones, H.C. ; Ketchen, M.B. ; Kim, K.K. ; Kleinsasser, A.W. ; Notarys, H.A. ; Proto, G. ; Wang, R.H. ; Yogi, T.

Author_Institution

I.B.M. Research Center, Yorktown Heights, New York

Volume

21

Issue

2

fYear

1985

fDate

3/1/1985 12:00:00 AM

Firstpage

1032

Lastpage

1035

Abstract

A large number of highly robust and reliable thin film DC SQUIDs have been designed and fabricated which have excellent low frequency noise properties. Measurements performed on isolated devices have yielded a limit on the low frequency (1/f) flux noise component which is at least a factor of 60 below the average value reported for devices of this kind. The corresponding energy factor in the white noise region is 770 h at 0.1 Hz. The input coil inductance is 0.7 μH and the coupling efficiency α = 0.9. The substantial reduction of the low frequency noise in these SQUIDs demonstrates that improvements in the performance of these devices in the white noise region can be obtained without sacrificing the low frequency resolution.

Keywords

Josephson device noise; Coils; Frequency measurement; Inductance; Low-frequency noise; Noise measurement; Noise robustness; Performance evaluation; SQUIDs; Transistors; White noise;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/TMAG.1985.1063725

Filename

1063725