DocumentCode :
1009442
Title :
An integrated high performance FASTBUS slave interface
Author :
Christiansen, J. ; Ljuslin, C.
Author_Institution :
CERN/ECP, Geneva, Switzerland
Volume :
40
Issue :
4
fYear :
1993
fDate :
8/1/1993 12:00:00 AM
Firstpage :
784
Lastpage :
787
Abstract :
A high-performance CMOS FASTBUS slave interface ASIC (application specific integrated circuit) supporting all addressing and data transfer modes defined in the IEEE 960-1986 standard is presented. The FASTBUS slave integrated circuit (FASIC) is an interface between the synchronous FASTBUS and a clock synchronous processor/memory bus. It can work stand-alone or together with a 32-b microprocessor. The FASIC is a programmable device, which makes possible its direct use in many different applications. A set of programmable address mapping windows can map FASTBUS addresses to convenient memory addresses and, at the same time, act as address decoding logic. Data rates of 100 Mbyte/s to FASTBUS can be obtained using an internal first-in first-out (FIFO) in the FASIC to buffer data between the two buses during block transfers. Message passing from FASTBUS, to a microprocessor on the slave module is supported. A compact (70-mm×170-mm) FASTBUS slave piggyback subcard interface, including level conversion between emitter-coupled logic (ECL) and transistor-transistor logic (TTL) signal levels, is implemented using surface mount components and the 208-pin FASIC chip
Keywords :
CMOS integrated circuits; application specific integrated circuits; physics computing; system buses; 100 Mbyte/s; CMOS; FASIC; FASTBUS slave interface ASIC; FIFO; IEEE 960-1986 standard; address decoding logic; emitter-coupled logic; first-in first-out; high performance; programmable address mapping windows; programmable device; transistor-transistor logic; Application specific integrated circuits; CMOS memory circuits; Clocks; Decoding; Fastbus; Logic; Microprocessors; Monitoring; Protection; Registers;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.256661
Filename :
256661
Link To Document :
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