DocumentCode :
1009522
Title :
Time domain simulation of Shapiro steps in Josephson junctions
Author :
Imai, Syozo ; Morita, Seizo ; Shinagawa, Mitsuru ; Takeuti, Yosihisa ; Mikoshiba, Nobuo
Author_Institution :
Tohoku University, Sendai, Japan
Volume :
21
Issue :
2
fYear :
1985
fDate :
3/1/1985 12:00:00 AM
Firstpage :
910
Lastpage :
913
Abstract :
Using the time domain formulation of the theory of the tunnel junction, we investigated Shapiro steps by digital simulation, under the condition of a constant current source given by I_{dc} + I_{rf} \\sin \\omega t . The integral kernels for the Josephson and the quasiparticle current were computed assuming a nonzero pair breaking parameter \\delta =0.1 , and T = 0K. We obtained Irfdependence of the zeroth and first Shapiro steps, I0and I1, and the frequency dependence of I_{1}^{MAX} , the maximum of the first Shapiro step as a function of Irf, for a few values of the junction capacitance. we found the following results. (1) I_{1}^{MAX}/I_{c} (Ic:the critical current), showed the Riedel peak at \\omega /\\omega _{g} \\simeq 1 , where ωgis the gap frequency 4 Δ/h. (2) For \\omega /\\omega _{g} > 1\\cdot I_{1}^{MAX}/I_{c} agrees well with that for the constant voltage bias. (3) As the frequency becomes smaller below \\omega _{g} \\cdot I_{1}^{MAX}/I_{c} is severely depressed compared to that for the constant voltage bias.
Keywords :
Josephson devices; Josephson junction; Capacitance; Critical current; Digital simulation; Equations; Frequency dependence; Josephson effect; Josephson junctions; Kernel; Microscopy; Voltage;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1985.1063753
Filename :
1063753
Link To Document :
بازگشت