DocumentCode
1009522
Title
Time domain simulation of Shapiro steps in Josephson junctions
Author
Imai, Syozo ; Morita, Seizo ; Shinagawa, Mitsuru ; Takeuti, Yosihisa ; Mikoshiba, Nobuo
Author_Institution
Tohoku University, Sendai, Japan
Volume
21
Issue
2
fYear
1985
fDate
3/1/1985 12:00:00 AM
Firstpage
910
Lastpage
913
Abstract
Using the time domain formulation of the theory of the tunnel junction, we investigated Shapiro steps by digital simulation, under the condition of a constant current source given by
. The integral kernels for the Josephson and the quasiparticle current were computed assuming a nonzero pair breaking parameter
, and T = 0K. We obtained Irf dependence of the zeroth and first Shapiro steps, I0 and I1 , and the frequency dependence of
, the maximum of the first Shapiro step as a function of Irf , for a few values of the junction capacitance. we found the following results. (1)
(Ic :the critical current), showed the Riedel peak at
, where ωg is the gap frequency 4 Δ/h. (2) For
agrees well with that for the constant voltage bias. (3) As the frequency becomes smaller below
is severely depressed compared to that for the constant voltage bias.
. The integral kernels for the Josephson and the quasiparticle current were computed assuming a nonzero pair breaking parameter
, and T = 0K. We obtained I
, the maximum of the first Shapiro step as a function of I
(I
, where ω
agrees well with that for the constant voltage bias. (3) As the frequency becomes smaller below
is severely depressed compared to that for the constant voltage bias.Keywords
Josephson devices; Josephson junction; Capacitance; Critical current; Digital simulation; Equations; Frequency dependence; Josephson effect; Josephson junctions; Kernel; Microscopy; Voltage;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1985.1063753
Filename
1063753
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