• DocumentCode
    1009522
  • Title

    Time domain simulation of Shapiro steps in Josephson junctions

  • Author

    Imai, Syozo ; Morita, Seizo ; Shinagawa, Mitsuru ; Takeuti, Yosihisa ; Mikoshiba, Nobuo

  • Author_Institution
    Tohoku University, Sendai, Japan
  • Volume
    21
  • Issue
    2
  • fYear
    1985
  • fDate
    3/1/1985 12:00:00 AM
  • Firstpage
    910
  • Lastpage
    913
  • Abstract
    Using the time domain formulation of the theory of the tunnel junction, we investigated Shapiro steps by digital simulation, under the condition of a constant current source given by I_{dc} + I_{rf} \\sin \\omega t . The integral kernels for the Josephson and the quasiparticle current were computed assuming a nonzero pair breaking parameter \\delta =0.1 , and T = 0K. We obtained Irfdependence of the zeroth and first Shapiro steps, I0and I1, and the frequency dependence of I_{1}^{MAX} , the maximum of the first Shapiro step as a function of Irf, for a few values of the junction capacitance. we found the following results. (1) I_{1}^{MAX}/I_{c} (Ic:the critical current), showed the Riedel peak at \\omega /\\omega _{g} \\simeq 1 , where ωgis the gap frequency 4 Δ/h. (2) For \\omega /\\omega _{g} > 1\\cdot I_{1}^{MAX}/I_{c} agrees well with that for the constant voltage bias. (3) As the frequency becomes smaller below \\omega _{g} \\cdot I_{1}^{MAX}/I_{c} is severely depressed compared to that for the constant voltage bias.
  • Keywords
    Josephson devices; Josephson junction; Capacitance; Critical current; Digital simulation; Equations; Frequency dependence; Josephson effect; Josephson junctions; Kernel; Microscopy; Voltage;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1985.1063753
  • Filename
    1063753