• DocumentCode
    1009876
  • Title

    Microwave technique for reflector antenna profile measurement

  • Author

    Bennett, Janine C. ; Swan, D.G.

  • Author_Institution
    University of Sheffield, Department of Electronics & Electrical Engineering, Sheffield, UK
  • Volume
    21
  • Issue
    13
  • fYear
    1985
  • Firstpage
    560
  • Lastpage
    561
  • Abstract
    A method for microwave measurement of the reflector antenna surface profile is described. The technique uses a focused monostatic secondary reflector located on axis at approximately two focal lenths from the reflector under test. Measurement of the two-ways phase change provides profile error information over a set of annular sections. Practical results are provided to illustrate the spatial resolution and sensitivity of the technique.
  • Keywords
    microwave antennas; microwave measurement; reflector antennas; surface topography measurement; annular sections; focused monostatic secondary reflector; microwave measurement; profile error information; profile measurement; reflector antenna; sensitivity; spatial resolution; two-way phase change;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19850396
  • Filename
    4251326
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1009876