Title :
Introduction to the Special Issue on Negative Bias Temperature Instability
Author :
Rosa, G. La ; Krishnan, A.
Abstract :
The nine invited papers in this special issue are intended to reflect the current thinking among different researchers on the controversial aspects of the negative bias temperature instability (NBTI) mechanism.
Keywords :
CMOS technology; Circuit simulation; MOSFET circuits; Materials reliability; Negative bias temperature instability; Niobium compounds; Physics; Special issues and sections; Stress; Titanium compounds;
Journal_Title :
Device and Materials Reliability, IEEE Transactions on
DOI :
10.1109/TDMR.2007.914389
