1010039

"A method of determining impurity diffusion coefficients and surface concentrations of drift transistors"

Happ, W.W. ; Greenberg, L.S. ; Martowska, Z.A.

Raytheon, Newton, Mass.

3

2

1956

4/1/1956 12:00:00 AM

109

109

Contracts; Electrons; Frequency conversion; Frequency modulation; Impurities; Insertion loss; Laboratories; Magnetic circuits; Matrix converters; P-n junctions; Power generation; Pulse amplifiers; Semiconductor impurities; Signal analysis; Switches; Telephony; Voltage; Water resources;

English

Electron Devices, IRE Transactions on

ieee

0096-2430

jour

10.1109/T-ED.1956.14120

1472039