DocumentCode :
1010091
Title :
"Vacuum-baking encapsulation techniques and improved reliability of npn alloy transistors"
Author :
Burcham, N.P. ; Miller, Paul
Author_Institution :
Bell Telephone Laboratories
Volume :
3
Issue :
2
fYear :
1956
fDate :
4/1/1956 12:00:00 AM
Firstpage :
110
Lastpage :
110
Keywords :
Apertures; Electrodes; Electron tubes; Encapsulation; Gallium alloys; Gettering; Impurities; Laboratories; Phosphors; Production; Radar; Stability; Telephony; Vacuum technology; Writing;
fLanguage :
English
Journal_Title :
Electron Devices, IRE Transactions on
Publisher :
ieee
ISSN :
0096-2430
Type :
jour
DOI :
10.1109/T-ED.1956.14125
Filename :
1472044
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1010091
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