DocumentCode :
1010171
Title :
Influence of doping on threshold current of semiconductor lasers
Author :
Haug, A.
Author_Institution :
Max-Planck-Institut fÿr Festkörperforschung, Stuttgart, West Germany
Volume :
21
Issue :
18
fYear :
1985
Firstpage :
792
Lastpage :
794
Abstract :
Doping of the active layer of a semiconductor laser reduces the threshold carrier density, the more so the higher the doping level. As a consequence, the threshold current goes through a minimum dependent on doping. This minimum arises for doping densities of the order of 1018 cm¿3, and lies about 25% below the value without doping for an n-doped InGaAsP laser. As the temperature dependence of the threshold current is simultaneously weaker (T0¿85°), appropriate n-doping may improve the efficiency of a semiconductor laser. Additionally, it is shown that n-doping is more favourable than p-doping.
Keywords :
III-V semiconductors; carrier density; gallium arsenide; indium compounds; semiconductor doping; semiconductor junction lasers; III-V semiconductors; InGaAsP laser; active layer; doping; doping densities; semiconductor lasers; threshold carrier density; threshold current;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19850559
Filename :
4251358
Link To Document :
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