DocumentCode
1010375
Title
Strained-quantum-well, modulation-doped, field-effect transistor
Author
Zipperian, T.E. ; Drummond, T.J.
Author_Institution
Sandia National Laboratories, Albuquerque, USA
Volume
21
Issue
18
fYear
1985
Firstpage
823
Lastpage
824
Abstract
A new modulation-doped field-effect transistor structure which employs a thin (8 nm) strained layer of In 0.25 Ga 0.75 As as the channel is described. The prototype device with a 2.9 ¿m gate length had a peak, room-temperature, unilluminated extrinsic transconductance of 91 mS/mm (VDS = 1 V). If device performance scaled linearly with gate length to 1 ¿m, as do (Al, Ga)As/GaAs, single-interface, modulation-doped FETs, this is the best room-temperature performance reported to date for an (In, Ga)As channel, modulation-doped transistor. Furthermore, the transconductance of the strained-quantum-well transistor proved to be almost constant with gate voltage, varying less than 13% over a 0.5 V range at 77 K. This will allow the fabrication of extremely linear microwave amplifiers and supports the assertion that the current conduction path is the (In, Ga)As channel.
Keywords
high electron mobility transistors; (In, Ga)As channel; In0.25Ga0.75As; MODFET; current conduction path; extrinsic transconductance 91 m5/mm; gate length 2.9 microns; linear microwave amplifiers; modulation-doped field-effect transistor structure; room-temperature performance; strained-quantum-well transistor; transconductance;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19850580
Filename
4251380
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