Title :
Intrinsic lineshape and FM response of modulated semiconductor lasers
Author :
Eichen, E. ; Melman, Paul ; Nelson, W.H.
Author_Institution :
GTE Laboratories, Incorporated, Waltham, USA
Abstract :
A new method for measuring the FM response and the intrinsic linewidth of modulated semiconductor lasers is reported. No additional stochastic line broadening has been observed for direct modulation of buried-heterostructure 1.3 ¿m lasers with modulation depths of less than 20%. Thus FSK systems employing heterodyne detection are expected not to exhibit any additional phase noise penalty due to direct current modulation.
Keywords :
frequency modulation; laser variables measurement; optical modulation; semiconductor junction lasers; spectral line breadth; 1.3 microns; BH lasers; FM response; FSK systems; direct modulation; heterodyne detection; intrinsic linewidth; measurement method; modulated semiconductor lasers; modulation depths; phase noise; stochastic line broadening;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19850599
