• DocumentCode
    1010605
  • Title

    Smooth Pole Tracking Technique by Power MOSFET Array in Low-Dropout Regulators

  • Author

    Lin, Yung-Hsin ; Zheng, Kuo-Lin ; Chen, Ke-Horng

  • Author_Institution
    Dept. of Electr. & Control Eng., Nat. Chiao Tung Univ., Hsinchu
  • Volume
    23
  • Issue
    5
  • fYear
    2008
  • Firstpage
    2421
  • Lastpage
    2427
  • Abstract
    This paper proposes an advanced Q-reduction technique of pole-splitting compensations for low dropout (LDO) regulator. The output pole is load dependent and may cause the scenario of complex poles when load current changes. LDO regulators may oscillate because high-Q incurs the less gain and phase margins. The reasons of causing complex poles depend on the design methodology. For the design of capacitor-free LDO regulator, high-Q issue happens when load current changes from heavy to light. Recent literature provides a method to alleviate the high-Q problem. However, large dropout voltage in case of suddenly large loads forces designers to include a small load capacitor as an indispensable component for supplying system-on-chip (SoC) systems. Different to the case of capacitor-free LDO regulators, high- Q issue happens when load current changes from light to heavy. According to our proposed power MOSFET array, the high-Q problem can be alleviated and prevent LDO regulators from oscillating when load changes. Experimental results promise the stability and show the improvement of load and line regulations.
  • Keywords
    power MOSFET; voltage regulators; Q-reduction technique; low-dropout regulators; pole-splitting compensations; power MOSFET array; smooth pole tracking technique; Capacitors; Design methodology; Frequency; Load management; MOSFET circuits; Operational amplifiers; Power MOSFET; Regulators; System-on-a-chip; Voltage; $Q$-reduction; Capacitor-free; complex pole; low-dropout regulator (LDO); power MOSFET array;
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/TPEL.2008.2002053
  • Filename
    4689442