Title :
Simple measurement of the properties of a distributed resistor-capacitor line
Author :
Pimbley, J.M. ; Michon, G.J.
Author_Institution :
Dept. of Math. Sci., Rensselaer Polytech. Inst., Troy, NY, USA
fDate :
8/1/1988 12:00:00 AM
Abstract :
An expression is derived that allows the resistance and capacitance per unit length in a distributed resistance-capacitance line to be determined with one measurement of AC current at a single frequency. These distributed structures occur frequently in semiconductor electronics and determine the device frequency response. The method is intended for cases such as engineering failure analysis of existing designs where measurement options are limited
Keywords :
electric current measurement; failure analysis; frequency response; integrated circuit technology; AC current; capacitance per unit length; device frequency response; distributed resistor-capacitor line; distributed structures; engineering failure analysis; monolithic IC; resistance per unit length; semiconductor electronics; Capacitance; Electrical resistance measurement; Equations; Frequency; Image storage; Integrated circuit technology; MOSFET circuits; Resistors; Switching circuits; Transient response;
Journal_Title :
Electron Devices, IEEE Transactions on
