• DocumentCode
    1010779
  • Title

    The effect of collector capacity on the transient response of junction transistors

  • Author

    Easley, James W.

  • Author_Institution
    Bell Telephone Laboratories, Whippany, N.J.
  • Volume
    4
  • Issue
    1
  • fYear
    1957
  • Firstpage
    6
  • Lastpage
    14
  • Abstract
    The effect of collector depletion layer capacity on the transient response of junction transistors to a current input is calculated for the case of a resistive load. Expressions are given for the small-signal rise-time of the common-base, emitter, and collector configurations and for the large-signal turn-on and decay times of the common-emitter and collector configurations. The analysis shows that the transient durations under most conditions of operation are approximately ( 1 + \\omega _{\\alpha }R_{L}C_{c} ) times those which would be predicted for the short-circuit output approximation reported by Moll [1]. Experimental results are reported which exhibit an excellent agreement with the analysis over a wide range of \\omega _{\\alpha }R_{L}C_{c} . An empirical examination has been made of the dependence of large-signal switching time on the range of operating point excursion. A satisfactory approximate representation of this dependence is provided by a first-order correction factor, which takes into account the functional dependence of ωαand Ccon collector voltage.
  • Keywords
    Current measurement; Electron devices; Frequency; Frequency domain analysis; Helium; Laboratories; Laplace equations; Linear systems; Telephony; Terminology; Transient analysis; Transient response; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IRE Transactions on
  • Publisher
    ieee
  • ISSN
    0096-2430
  • Type

    jour

  • DOI
    10.1109/T-ED.1957.14193
  • Filename
    1472172