DocumentCode :
1010779
Title :
The effect of collector capacity on the transient response of junction transistors
Author :
Easley, James W.
Author_Institution :
Bell Telephone Laboratories, Whippany, N.J.
Volume :
4
Issue :
1
fYear :
1957
Firstpage :
6
Lastpage :
14
Abstract :
The effect of collector depletion layer capacity on the transient response of junction transistors to a current input is calculated for the case of a resistive load. Expressions are given for the small-signal rise-time of the common-base, emitter, and collector configurations and for the large-signal turn-on and decay times of the common-emitter and collector configurations. The analysis shows that the transient durations under most conditions of operation are approximately ( 1 + \\omega _{\\alpha }R_{L}C_{c} ) times those which would be predicted for the short-circuit output approximation reported by Moll [1]. Experimental results are reported which exhibit an excellent agreement with the analysis over a wide range of \\omega _{\\alpha }R_{L}C_{c} . An empirical examination has been made of the dependence of large-signal switching time on the range of operating point excursion. A satisfactory approximate representation of this dependence is provided by a first-order correction factor, which takes into account the functional dependence of ωαand Ccon collector voltage.
Keywords :
Current measurement; Electron devices; Frequency; Frequency domain analysis; Helium; Laboratories; Laplace equations; Linear systems; Telephony; Terminology; Transient analysis; Transient response; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IRE Transactions on
Publisher :
ieee
ISSN :
0096-2430
Type :
jour
DOI :
10.1109/T-ED.1957.14193
Filename :
1472172
Link To Document :
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