Title :
LSI Testing Techniques
Author :
Abadir, M.S. ; Reghbati, H.K.
Author_Institution :
University of Saskatchewan
Abstract :
Tests good for SSI and MSI circuits can´t cope with the complexity of LSI. New techniques for test generation and response evaluation are required.
Keywords :
Automatic testing; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Large scale integration; Microprocessors; Monitoring; System testing;
Journal_Title :
Micro, IEEE
DOI :
10.1109/MM.1983.291070
