• DocumentCode
    1010828
  • Title

    LSI Testing Techniques

  • Author

    Abadir, M.S. ; Reghbati, H.K.

  • Author_Institution
    University of Saskatchewan
  • Volume
    3
  • Issue
    1
  • fYear
    1983
  • Firstpage
    34
  • Lastpage
    51
  • Abstract
    Tests good for SSI and MSI circuits can´t cope with the complexity of LSI. New techniques for test generation and response evaluation are required.
  • Keywords
    Automatic testing; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Large scale integration; Microprocessors; Monitoring; System testing;
  • fLanguage
    English
  • Journal_Title
    Micro, IEEE
  • Publisher
    ieee
  • ISSN
    0272-1732
  • Type

    jour

  • DOI
    10.1109/MM.1983.291070
  • Filename
    4070873
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1010828