Title :
Ellipsoidal method for design centering and yield estimation
Author :
Wojciechowski, Jacek M. ; Vlach, Jiri
Author_Institution :
Warsaw Univ. of Poland, Poland
fDate :
10/1/1993 12:00:00 AM
Abstract :
A method for constraint region approximation, design centering and yield estimation is introduced. Extreme points of the constraint region are identified by inscribing into it the largest possible ellipsoid. Ellipsoid center is the point that centers the design. Ellipsoidal, polytope and second order Taylor series approximation schemes to the constraint region are discussed. Accuracy and implementation of the method are outlined. Two examples testing the method are included and applications to centering, tolerancing and yield estimation are shown
Keywords :
constraint theory; network parameters; network synthesis; series (mathematics); constraint region approximation; design centering; ellipsoidal approximation; polytope approximation; second order Taylor series approximation; tolerancing; yield estimation; Circuit simulation; Circuit testing; Costs; Design methodology; Design optimization; Ellipsoids; Optimization methods; Performance analysis; Statistical distributions; Yield estimation;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
