Title :
Applications of one-dimensional cellular automata and linear feedback shift registers for pseudo-exhaustive testing
Author :
Damarla, Thyagaraju ; Sathaye, Avinash
Author_Institution :
Kentucky Univ., Lexington, KY, USA
fDate :
10/1/1993 12:00:00 AM
Abstract :
Recent studies have shown that cellular automata (CA) can be used in place of linear feedback shift registers (LFSRs). Due to their regular structure and local feedback connections, VLSI layout of CA is easy and results in saving silicon area. Some properties of CAs derived using Rules 90 and 150 in terms of characteristic polynomials are presented. In particular, (a) computation of characteristic polynomials in CA, (b) computation of sequence lengths generated by various CA/LFSRs, and (c) pseudo-exhaustive testing by sequences generated by CA/LFSRs are accomplished
Keywords :
VLSI; cellular automata; integrated circuit testing; logic testing; shift registers; VLSI layout; characteristic polynomials; linear feedback shift registers; one-dimensional cellular automata; pseudo-exhaustive testing; sequence lengths; sequences; Automatic testing; Built-in self-test; Character generation; Linear feedback shift registers; Logic testing; Polynomials; Silicon; State-space methods; System testing; Test pattern generators;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
