DocumentCode :
1011290
Title :
Application of a Logarithmic Complementary Metal–Oxide–Semiconductor Camera in White-Light Interferometry
Author :
Egan, Patrick ; Lakestani, Fereydoun ; Whelan, Maurice P. ; Connelly, Michael J.
Author_Institution :
Univ. of Limerick, Limerick
Volume :
57
Issue :
1
fYear :
2008
Firstpage :
134
Lastpage :
139
Abstract :
This paper describes the characterization, modeling, and application of a direct-readout complementary metal-oxide-semiconductor (CMOS) camera in white-light interferometry (WLI). The camera that was used consisted of a direct-readout 1024times1024 pixel logarithmic CMOS sensor. A continuous analog voltage from each pixel was converted to an 8-bit value by an internal analog-to-digital converter and processed with a digital signal processor. A mathematical model relating the input light intensity to the 8-bit digitized output is developed, which is critical in applications where knowledge of the scene intensity is essential to estimating the maximum allowable frame rates. The camera was utilized in WLI, and its application is analyzed in terms of maximum output signal amplitude, imaging speed, and light intensity. The mathematical modeling is implemented with SPICE simulations and verified with experimental data.
Keywords :
CMOS image sensors; SPICE; analogue-digital conversion; digital signal processing chips; light interferometry; readout electronics; 8-bit digitized output; SPICE simulations; complementary metal-oxide-semiconductor camera; continuous analog voltage; digital signal processor; direct-readout CMOS camera; imaging speed; internal analog-to-digital converter; logarithmic CMOS sensor; maximum output signal amplitude; picture size 1024 pixel; white-light interferometry; Analog-digital conversion; CMOS image sensors; Cameras; Digital signal processors; Layout; Mathematical model; Optical interferometry; Semiconductor device modeling; Sensor phenomena and characterization; Voltage; Calibration; cameras; complementary metal–oxide–semiconductor field effect transistors (CMOSFETs); machine vision; modeling; optical interferometry;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2007.907962
Filename :
4404125
Link To Document :
بازگشت