Title :
Methods of detecting contaminants on electron device components
Author_Institution :
Bell Telephone Laboratories, Inc., Murray Hill, N. J.
fDate :
4/1/1957 12:00:00 AM
Keywords :
Electron devices; Electron tubes; Flat panel displays; Gettering; Guns; Laboratories; Leak detection; Nose; Pollution measurement; Seals; Surface contamination; TV; Telephony; Testing; Thermal stability;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1957.14248
