Title :
Measurement of Rayleigh backscatter-induced linewidth reduction
Author :
Mark, J. ; B¿¿dtker, E. ; Tromborg, B.
Author_Institution :
Technical University of Denmark, Electromagnetics Institute, Lyngby, Denmark
Abstract :
We present measurements of the linewidth reduction for a semiconductor laser exposed to the Rayleigh backscatter from a single-mode fibre. The linewidth is measured as a function of fibre length and laser to fibre coupling efficiency and shows good agreement with the estimate from a simple statistical model.
Keywords :
Rayleigh scattering; semiconductor junction lasers; spectral line breadth; Rayleigh backscatter; fibre length; laser to fibre coupling efficiency; linewidth reduction; semiconductor laser; single-mode fibre; statistical model;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19850714
