DocumentCode :
1011806
Title :
Structure and morphology of RF sputtered carbon overlayer films
Author :
Agarwal, Shashi
Author_Institution :
Memorex Corporation, Santa Clara, California.
Volume :
21
Issue :
5
fYear :
1985
fDate :
9/1/1985 12:00:00 AM
Firstpage :
1527
Lastpage :
1529
Abstract :
The morphology and structure of RF sputtered carbon films have been investigated. The growth of these films is shown to take place by the formation and agglomeration of rounded particles. The film growth mechanism and the substrate nature were the primary factors determining the morphology of carbon films. The structure of the carbon films was found to be predominantly amorphous.
Keywords :
Chromium; Diamond-like carbon; Electrons; Magnetic films; Optical films; Radio frequency; Sputtering; Surface cracks; Surface morphology; Surface topography;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1985.1063948
Filename :
1063948
Link To Document :
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