Title :
A method of accurate thickness determination of germanium wafers suitable for transistor production
Author_Institution :
RCA Laboratories, Princeton, N. J.
Keywords :
Brightness; Circuits; Collimators; Contracts; Electromagnetic wave absorption; Filters; Germanium; Iron; Production; Proposals; Radiation detectors; Scintillation counters; Solid scintillation detectors; Thickness measurement; Writing;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1957.14313
