Title :
Defect-tolerant active matrix circuit with duplicated data input routes for large liquid crystal display
Author :
Sakai, Shin´ichi ; Kohda, S. ; Minagawa, C. ; Masuda, Kohji
Author_Institution :
NTT, Musashino Electrical Communication Laboratory, Musashino, Japan
Abstract :
The letter describes a new active matrix circuit that has duplicated data input routes as a means of tolerating defects and enhancing the yield of large liquid crystal displays. With this circuit, when one route is defective and the other route is not, correct data can be automatically displayed without any additional process such as defect detecting and laser repairing.
Keywords :
VLSI; circuit reliability; field effect integrated circuits; liquid crystal displays; redundancy; thin film transistors; TFT circuit; VLSI; active matrix circuit; duplicated data input routes; large liquid crystal display; monolithic implementation; pixel circuit; thin film transistors;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19850746
