DocumentCode :
1012317
Title :
Domain formation characteristics during thermomagnetic recording for amorphous TbFe and TbFeCo alloy thin films
Author :
Lee, Seh Kwang ; Kim, Soon Gwang
Author_Institution :
Div. of Mater. Sci. & Eng., Korea Adv. Inst. of Sci. & Technol., Cheongyrang, Seoul, South Korea
Volume :
25
Issue :
5
fYear :
1989
fDate :
9/1/1989 12:00:00 AM
Firstpage :
4039
Lastpage :
4041
Abstract :
The configurational characteristics of thermomagnetically written domains under a static laser irradiation condition were observed by using a polarizing microscope. The shapes of the domains were categorized into three distinctly different types: (1) circular domains with size almost independent of the applied field, (2) domains growing in size and assuming smoother boundaries with increasing applied field, and (3) domains unrecordable at any condition. It was confirmed that the domain configurations were determined mainly by which one was the dominant controlling factor between demagnetizing and domain wall energy at elevated temperatures in the thermomagnetic recording process. The bit shape irregularity found in some alloys of TbFe was attributed to nonuniformity in magnetic properties inherent in the amorphous structure
Keywords :
cobalt alloys; ferrimagnetic properties of substances; iron alloys; magnetic domain walls; magnetic properties of amorphous substances; magnetic thin films; magneto-optical recording; optical microscopy; terbium alloys; TbFe alloy thin films; TbFeCo alloy thin films; amorphous structure; bit shape irregularity; circular domains; configurational characteristics; domain configurations; domain wall energy; static laser irradiation; thermomagnetic recording; Amorphous materials; Laser theory; Materials science and technology; Microscopy; Polarization; Saturation magnetization; Shape control; Sputtering; Temperature; Transistors;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.42516
Filename :
42516
Link To Document :
بازگشت