Title :
Measurements on transistors subjected to nuclear radiation
Author :
Lindsay, John ; Parker, Julian ; Schach, S. ; Willey, J.
Author_Institution :
RCA, Camden, N. J.
fDate :
4/1/1958 12:00:00 AM
Keywords :
Assembly systems; Electromagnetic heating; Electron beams; Frequency; Inductors; Magnetic fields; Magnetrons; Neutrons; Nuclear measurements; Power generation; Power supplies; Power transmission lines; Sockets; Surface treatment; Testing; Voltage;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1958.14352