DocumentCode
1012433
Title
RF MEMS Testing - Beyond the S-Parameters
Author
Ebel, John L. ; Hyman, Daniel J. ; Newman, Harvey S.
Author_Institution
Wright-Patterson AFB, Wright-Patterson AFB
Volume
8
Issue
6
fYear
2007
Firstpage
76
Lastpage
88
Abstract
This article surveys a variety of tests and measurements that have been used for switch and relay characterization, and it describes their strengths, weaknesses, and applicability in the design and development process.
Keywords
S-parameters; microrelays; RF MEMS testing; S-parameters; microrelays; microswitches; Contact resistance; Dielectric losses; Insertion loss; Radio frequency; Radiofrequency microelectromechanical systems; Resonance; Scattering parameters; Switches; System testing; Voltage;
fLanguage
English
Journal_Title
Microwave Magazine, IEEE
Publisher
ieee
ISSN
1527-3342
Type
jour
DOI
10.1109/MMM.2007.907737
Filename
4405052
Link To Document