Title :
Atmospheric pressure of nitrogen plasmas in a ferroelectric packed bed barrier discharge reactor. Part I. Modeling
Author :
Takaki, Koichi ; Chang, Jen-Shih ; Kostov, Konstantin G.
Author_Institution :
Dept. of Eng. Phys., McMaster Univ., Hamilton, Ont., Canada
fDate :
6/1/2004 12:00:00 AM
Abstract :
Numerical modelling of ferroelectric packed bed nonthermal plasma reactor has been conducted to predict plasma parameters in a pure nitrogen environment. Simplified time averaged one-dimensional physical model based on Poisson´s equation for electric field and transport equation for electrons was developed. The mean electron energy was obtained by a swarm relationship from calculated electric field profiles and plasma neutral conditions. For chemical model, N+, N2+, N3+, N4+, N*, N2* and electron were considered where N* and N2* are the total excited atoms and molecules, respectively. The results show that all the plasma parameters increase with increasing applied AC voltage and pellet dielectric constant. The numerical results also show that the dominant ion is N4+ and the metastable molecule density is much higher than radical and the electron densities at atmospheric gas pressure.
Keywords :
Poisson equation; air pollution control; ferroelectric devices; metastable states; nitrogen; partial discharges; permittivity; plasma chemistry; AC voltage; N; PFC; Poisson equation; atmospheric gas pressure; dielectric barrier discharge; electric field; electron density; excited atom; excited molecule; ferroelectric packed bed; mean electron energy; metastable molecule density; nitrogen plasma; nonthermal plasma reactor; one-dimensional physical model; partial discharge; pellet dielectric constant; plasma neutral condition; plasma parameter; swarm relationship; transport equation; Atmospheric modeling; Atmospheric-pressure plasmas; Electrons; Ferroelectric materials; Inductors; Nitrogen; Plasma chemistry; Plasma transport processes; Poisson equations; Predictive models;
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
DOI :
10.1109/TDEI.2004.1306726