Title :
Linewidth determination from electrical noise measurements on semiconductor lasers
Author :
Andrekson, Peter A. ; Andersson, Patrik ; Alping, Arne
Author_Institution :
Chalmers University of Technology, Department of Electrical Measurements, Gothenburg, Sweden
Abstract :
A novel method to determine the linewidth of a semiconductor laser is described. By measuring the noise voltage at the electrical terminal, the electron density variations in the gain medium can be determined. Since these variations are the major cause of the linewidth of semiconductor lasers, both the linewidth and the lineshape can be determined from electrical measurements if the ¿-parameter is known and the parasitic impedances of the laser are small.
Keywords :
electric noise measurement; laser variables measurement; semiconductor junction lasers; spectral line breadth; electrical noise measurements; electrical terminal; electron density variations; gain medium; lineshape; linewidth determination; noise voltage; parasitic impedances; semiconductor lasers; ¿-parameter;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19850779
