Title :
Hollow metallic waveguides in silicon V-grooves
Author :
McMullin, J.N. ; Narendra, R. ; James, C.R.
Author_Institution :
TRLabs, Edmonton, Alta., Canada
Abstract :
Hollow waveguides with metal walls in silicon v-grooves have been fabricated. The propagation of light at wavelengths of 633 nm, 780 nm, 980 nm, and 1310 nm has been studied. It has been found that the intensity decays according to an inverse linear law rather than an exponential law. The equivalent losses in dB/cm are in the range of 1 to 6 over a distance of 1.5 cm. Numerical simulations that include a realistic index of refraction for the metal walls have been carried out, and the inverse linear intensity law is verified for Gaussian beams. Polarization effects due to the triangular geometry are also observed.<>
Keywords :
integrated optics; light polarisation; optical losses; optical waveguides; refractive index; 1310 nm; 633 nm; 780 nm; 980 nm; Gaussian beams; equivalent losses; hollow metallic waveguides; intensity decays; inverse linear intensity law; inverse linear law; light propagation; metal walls; polarization effects; realistic index of refraction; silicon V-grooves; triangular geometry; Dielectric losses; Hollow waveguides; Integrated circuit interconnections; Optical attenuators; Optical fiber communication; Optical refraction; Optical waveguides; Rectangular waveguides; Silicon; Very large scale integration;
Journal_Title :
Photonics Technology Letters, IEEE
