Title :
Theoretical and experimental determination of the time response of junction temperature of a power transistor
Author :
Heaner, S. ; Eiler, A.
Author_Institution :
Minneapolis-Honeywell Regulator Co., Minneapolis, Minn.
fDate :
4/1/1958 12:00:00 AM
Keywords :
Circuits; Copper; Couplers; Frequency; Geometry; Instruments; Microwave devices; Noise figure; P-n junctions; Power transistors; Radiofrequency amplifiers; Regulators; Sandwich structures; Temperature; Thermal conductivity; Thermal resistance; Time factors;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1958.14368
