Title :
Control of lifetime-sensitive device characteristics by electron bombardment
Author_Institution :
Bell Telephone Labs., Inc., Murray Hill, N. J.
fDate :
4/1/1958 12:00:00 AM
Keywords :
Cameras; Circuits; Contacts; Delay; Driver circuits; Electric variables; Electrons; III-V semiconductor materials; Packaging; Photoconducting devices; Photoconductivity; Semiconductor diodes; Silicon; Temperature;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1958.14372
