Title :
Extended-range optical low-coherence reflectometry using a recirculating delay technique
Author :
Baney, Douglas M. ; Sorin, Wayne V.
Author_Institution :
Hewlett-Packard Co., Palo Alto, CA, USA
Abstract :
We propose a novel technique allowing for a substantial increase in the distance measurement range for optical low-coherence reflectometry. By introducing a recirculating delay into the interferometer reference path, we achieve a 100 times increase in range compared to previous optical low-coherence reflectometry techniques. At this extended range, a reflection sensitivity greater than -80 dB is demonstrated at a probe wavelength of 1.55 mu m.<>
Keywords :
light coherence; light interferometry; optical links; reflectivity; reflectometry; sensitivity; 1.55 mum; distance measurement range; extended-range optical low-coherence reflectometry; interferometer reference path; probe wavelength; recirculating delay technique; reflection sensitivity; Delay; Optical fiber networks; Optical fibers; Optical interferometry; Optical modulation; Optical pumping; Optical reflection; Optical resonators; Optical sensors; Reflectometry;
Journal_Title :
Photonics Technology Letters, IEEE
