DocumentCode :
1012811
Title :
70-MC silicon transistor
Author :
Brower, W.C. ; Earhart, C.E.
Author_Institution :
Texas Instruments, Inc., Dallas, Texas
Volume :
5
Issue :
2
fYear :
1958
fDate :
4/1/1958 12:00:00 AM
Firstpage :
117
Lastpage :
117
Keywords :
Circuit testing; Cutoff frequency; Fabrication; Gain measurement; Geometry; Germanium; Impurities; Performance gain; Power measurement; Production; Silicon; Switches; VHF circuits; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IRE Transactions on
Publisher :
ieee
ISSN :
0096-2430
Type :
jour
DOI :
10.1109/T-ED.1958.14393
Filename :
1472436
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1012811
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