Title :
Photolithographic fabrication techniques for transistors which are an integral part of a printed circuit
fDate :
4/1/1958 12:00:00 AM
Keywords :
Circuit testing; Cutoff frequency; Fabrication; Gain measurement; Geometry; Germanium; Impurities; Performance gain; Power measurement; Printed circuits; Production; Silicon; Switches; VHF circuits; Voltage;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1958.14395
