Title :
Screening by aging test for highly reliable laser diodes
Author :
Fujita, O. ; Nakano, Yoshiaki ; Iwane, G.
Author_Institution :
NTT Atsugi Electrical Communication Laboratories, Atsugi, Japan
Abstract :
The aging behaviour of laser diodes developed for undersea optical transmission systems is studied. Highly reliable laser diodes can be selected by a preliminary aging test (70°C, 5 mW, 1000 h).
Keywords :
ageing; optical communication equipment; optical testing; reliability; semiconductor junction lasers; aging behaviour; aging test; laser diodes; reliability; undersea optical transmission systems;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19850829
