DocumentCode :
1013087
Title :
Micromechanical resonators with submicron capacitive gaps in 2 μm process
Author :
Shao, L.C. ; Palaniapan, M. ; Khine, L. ; Tan, W.W.
Author_Institution :
Nat. Univ. of Singapore, Singapore
Volume :
43
Issue :
25
fYear :
2007
Firstpage :
1427
Lastpage :
1428
Abstract :
An innovative gap reduction technique is reported to achieve sub-micron capacitive gaps for micromechanical resonators to boost the output signal using the standard low-cost 2 mum commercially available foundry process from MEMSCAP. Electrostatic actuation was used to reduce the gap size below the fabrication limitation. To demonstrate the proposed idea, a 6.35 MHz Lame-mode square resonator was designed, fabricated and tested. The resonator gap size was experimentally measured to be 0.64 mum, which boosted the resonance peak by 20 dB.
Keywords :
electrostatic actuators; micromechanical resonators; Lame-mode square resonator; MEMSCAP; electrostatic actuation; foundry process; frequency 6.35 MHz; gap reduction technique; micromechanical resonators; size 0.64 mum; size 2 mum; submicron capacitive gaps;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:20072841
Filename :
4405601
Link To Document :
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