• DocumentCode
    1013093
  • Title

    An 85-watt dissipation silicon power transistor

  • Author

    Aldrich, R.W. ; Lanzl, R.H. ; Maxwell, D.E. ; Percival, J.O. ; Waldner, M.

  • Author_Institution
    General Electric Co., Syracuse, N. Y.
  • Volume
    5
  • Issue
    4
  • fYear
    1958
  • Firstpage
    211
  • Lastpage
    215
  • Abstract
    Production prototype silicon transistors have been made using large area diffused base structures. Simultaneous diffusion of gallium and phosphorus is used to form the diffused base structures. The geometry and doping level of the structure can be controlled by varying the impurity source composition and temperature. The phosphorus surface concentration is a much less rapidly varying function of source temperature than is the gallium surface concentration, and is determined primarily by the source composition. Two line base contacts, one line emitter contact and a collector contact, are attached to the wafer by using appropriate alloys in conjunction with titanium or tungsten back-up plates. The structure then is encapsulated in a hermetically sealed package. The transistors are capable of dissipating 85 watts at a 25°C mounting base temperature and have been used in circuits, as is described, to deliver 25 watts Class A, 80 watts Class B in push-pull operation and peak currents of 10 amperes in pulsed operation.
  • Keywords
    Doping; Geometry; Impurities; Power transistors; Production; Prototypes; Silicon; Temperature control; Titanium alloys; Tungsten;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IRE Transactions on
  • Publisher
    ieee
  • ISSN
    0096-2430
  • Type

    jour

  • DOI
    10.1109/T-ED.1958.14424
  • Filename
    1472467