DocumentCode
1013234
Title
Large-signal rise-times in junction transistors
Author
Gartner, W.W.
Author_Institution
U. S. Army Signal Eng. Labs. Fort Monmouth, N. J.
Volume
5
Issue
4
fYear
1958
Firstpage
316
Lastpage
316
Keywords
Capacitance measurement; Charge carrier lifetime; Circuits; Current measurement; Cutoff frequency; Electrical resistance measurement; Electron devices; Frequency; Impedance; Laplace equations; Production facilities; Pulse amplifiers; Transient response;
fLanguage
English
Journal_Title
Electron Devices, IRE Transactions on
Publisher
ieee
ISSN
0096-2430
Type
jour
DOI
10.1109/T-ED.1958.14439
Filename
1472482
Link To Document