DocumentCode :
1013375
Title :
High density recording on particulate and thin film rigid disks
Author :
Speliotis, D.E.
Author_Institution :
Adv. Dev. Corp., Burlington, MA, USA
Volume :
25
Issue :
5
fYear :
1989
fDate :
9/1/1989 12:00:00 AM
Firstpage :
4048
Lastpage :
4050
Abstract :
Current development efforts in small rigid disks (5.25 and 3.5 inch) directed toward achieving linear flux reversal densities in the range of 20-35 kfci (787-1378 fc/mm) are discussed. In conjunction with appropriate encoding, this can yield linear bit densities in the range of 30-50 kbpi (about 1200-200 b/mm). The author compares the write current response at high bit densities and the bit density response of the various small developmental rigid disks in order to determine their relative potential for fulfilling these requirements. It is shown that the performance of the Ba-ferrite disks is comparable to that of the very high coercivity thin-film disks, while the performance of the Co-gamma disks is inferior, particularly with respect to resolution. The typical hysteretic parameters do not explain the observed differences in recording performance. Instead, the authors propose a different set of criteria based on remanence loops, which are expected to correlate much better with the high-density recording characteristics of the media
Keywords :
ferrite devices; hard discs; magnetic recording; magnetic thin film devices; remanence; Ba-ferrite disks; BaFe12O19; Co-gamma disks; Fe2O3-Co; bit density response; encoding; high-density recording characteristics; hysteretic parameters; linear bit densities; linear flux reversal densities; particulate recording media; recording performance; remanence loops; resolution; small rigid disks; thin film rigid disks; write current response; Coatings; Coercive force; Disk recording; Encoding; Magnetic anisotropy; Magnetic films; Magnetic heads; Magnetic recording; Sputtering; Transistors;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.42518
Filename :
42518
Link To Document :
بازگشت