Title :
The Development of Reliabililty in Industrial Control Systems
Author :
Williams, Theodore J.
Author_Institution :
Purdue Laboratory for Applied Industrial Control Purdue University
Abstract :
Hierarchical organization and distributed computing capability are the keys to the highly fault-tolerant, plant-wide control and management systems users demand today.
Keywords :
Analog computers; Application software; Control systems; Digital control; Industrial control; Instruments; Military computing; Reliability theory;
Journal_Title :
Micro, IEEE
DOI :
10.1109/MM.1984.291282
