Title : 
Numerical state-space average-value modeling of PWM DC-DC converters operating in DCM and CCM
         
        
            Author : 
Davoudi, Ali ; Jatskevich, Juri ; De Rybel, Tom
         
        
            Author_Institution : 
Illinois Univ. at Urbana-Champaign, Urbana, IL, USA
         
        
        
        
        
            fDate : 
7/1/2006 12:00:00 AM
         
        
        
        
            Abstract : 
State-space average-value modeling of pulsewidth modulation converters in continuous and discontinuous modes has received significant attention in the literature, and various models have been developed. This paper presents a new approach for generating the state-space average-value model. In the proposed methodology, the so-called duty-ratio constraint and the correction term are extracted numerically using the detailed simulation and are expressed as nonlinear functions of the duty cycle and average-value of the fast state variable. The parasitic effects of circuit elements are readily included. The resulting average-value model is compared to a hardware prototype, a detailed simulation, and several previously published models. The proposed model is shown to be very accurate in predicting the large-signal time-domain transients as well as the small-signal frequency-domain characteristics.
         
        
            Keywords : 
DC-DC power convertors; PWM power convertors; numerical analysis; state-space methods; CCM; DCM; PWM dc-dc converters; continuous mode; discontinuous mode; duty-ratio constraint; large-signal time-domain transients; nonlinear functions; parasitic effects; pulsewidth modulation converters; small-signal frequency-domain; state-space average-value modeling; Circuit simulation; DC-DC power converters; Hardware; Numerical models; Power system modeling; Predictive models; Pulse width modulation; Pulse width modulation converters; Switches; Virtual prototyping; Average-value modeling; dc–dc converters; discontinuous conduction mode (DCM); state-space averaging;
         
        
        
            Journal_Title : 
Power Electronics, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TPEL.2006.876848