Title :
Parametric amplifiers
Author :
Fitzgerald, P.M. ; Wade, G. ; Crumly, C.B.
Author_Institution :
Stanford Electronics Lab., Stanford Calif.
fDate :
4/1/1959 12:00:00 AM
Keywords :
Bandwidth; Circuit testing; Couplers; Electron devices; Electron tubes; Frequency; Klystrons; Laboratories; Low-noise amplifiers; Noise figure; RLC circuits; Structural beams; Telephony;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1959.14482