DocumentCode :
1013959
Title :
Direct measurement for the characteristic parameters of magnetic microstrip substrate
Author :
Zhu, Sheng-chuan ; Zhao, Li-qun
Author_Institution :
Peking University, Beijing, China
Volume :
21
Issue :
5
fYear :
1985
fDate :
9/1/1985 12:00:00 AM
Firstpage :
1800
Lastpage :
1802
Abstract :
We suggest a method for directly measuring the characteristic parameters of a microstrip substrate. By using a reflex ring resonator, the microstrip wavelength λm , the parameter 
(correspond to the reduce phase constant) and the attenuation constant α can be determined conveniently and precisely.
(correspond to the reduce phase constant) and the attenuation constant α can be determined conveniently and precisely.Keywords :
Microstrip; YIG materials/devices; Attenuation; Dielectric substrates; Frequency measurement; Micromagnetics; Microstrip resonators; Optical ring resonators; Permeability; Q measurement; Resonant frequency; Wavelength measurement;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1985.1064130
Filename :
1064130
Link To Document :
