• DocumentCode
    1014005
  • Title

    Maximum likelihood estimates, from censored data, for mixed-Weibull distributions

  • Author

    Jiang, Siyuan ; Kececioglu, Dimitri

  • Author_Institution
    Ford Motor Co., Dearborn, MI, USA
  • Volume
    41
  • Issue
    2
  • fYear
    1992
  • fDate
    6/1/1992 12:00:00 AM
  • Firstpage
    248
  • Lastpage
    255
  • Abstract
    An algorithm for estimating the parameters of mixed-Weibull distributions from censored data is presented. The algorithm follows the principle of the MLE (maximum likelihood estimate) through the EM (expectation and maximization) algorithm, and it is derived for both postmortem and non-postmortem time-to-failure data. The MLEs of the nonpostmortem data are obtained for mixed-Weibull distributions with up to 14 parameters in a five-subpopulation mixed-Weibull distribution. Numerical examples indicate that some of the log-likelihood functions of the mixed-Weibull distributions have multiple local maxima; therefore the algorithm should start at several initial guesses of the parameters set. It is shown that the EM algorithm is very efficient. On the average for two-Weibull mixtures with a sample size of 200, the CPU time (on a VAX 8650) is 0.13 s/iteration. The number of iterations depends on the characteristics of the mixture. The number of iterations is small if the subpopulations in the mixture are well separated. Generally, the algorithm is not sensitive to the initial guesses of the parameters
  • Keywords
    parameter estimation; reliability theory; statistical analysis; EM algorithm; MLE; censored data; expectation-maximisation algorithm; iterations; log-likelihood functions; maximum likelihood estimate; mixed-Weibull distributions; nonpostmortem data; parameter estimation; postmortem data; reliability; time-to-failure data; Data analysis; Data engineering; Failure analysis; Life estimation; Maximum likelihood estimation; Parameter estimation; Statistical analysis; Statistical distributions; Stress; Weibull distribution;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.257791
  • Filename
    257791