• DocumentCode
    1014273
  • Title

    Approximate inference for location and scale parameters with application to failure-time data

  • Author

    Viveros, Roman

  • Author_Institution
    Dept. of Math. & Stat., McMaster Univ., Hamilton, Ont., Canada
  • Volume
    42
  • Issue
    3
  • fYear
    1993
  • fDate
    9/1/1993 12:00:00 AM
  • Firstpage
    449
  • Lastpage
    454
  • Abstract
    A new method (SP/CI) for obtaining approximate confidence intervals for the location, scale, and quantiles based on sample data parameters is presented. The basis of SP/CI is a saddlepoint expansion; the requirements are the maximum likelihood estimate (MLE), a few cross derivatives of the log-likelihood evaluated at the MLE, and quantiles of the log(F) distribution. SP/CI is illustrated numerically on several type-II censored reliability data sets using the extreme value and log-normal models. The accuracy is investigated by numerical comparison with the exact results, with best linear invariant estimator (BLIE), as well as with the results from other approximate methods discussed in the literature, including the asymptotic normality of the MLE, the likelihood ratio (LR) statistic, and corrections to the LR statistic recently developed
  • Keywords
    failure analysis; maximum likelihood estimation; reliability theory; statistical analysis; MLE; SP/CI; approximate confidence intervals; approximate inference; asymptotic normality; cross derivatives; failure-time data; likelihood ratio statistic; linear invariant estimator; location parameters; log(F) distribution; log-likelihood; log-normal models; maximum likelihood estimate; quantiles; saddlepoint expansion; scale parameters; type-II censored reliability data sets; Data analysis; Data engineering; Exponential distribution; Maintenance engineering; Maximum likelihood estimation; Probability; Reliability engineering; Reliability theory; Statistical analysis; Statistics;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.257829
  • Filename
    257829