Reliability of 3-state device systems with simultaneous failures

Author

Satoh, Naoto ; Sasaki, Motoharu ; Yuge, Tetushi ; Yanagi, Shigeru

Author_Institution

Dept. of Electr. Eng., Nat. Defense Acad., Yokosuka, Japan

Volume

42

Issue

3

fYear

1993

fDate

9/1/1993 12:00:00 AM

Firstpage

470

Lastpage

477

Abstract

This work is concerned with computing the reliability of redundant systems of three-state (e.g., good, failed-open or failed-short) devices. Allowing for multiple failures, formulas are presented for calculating the reliability of a parallel-series system or a series-parallel system which is formed from three-state, non-DFM (dual failure-mode) devices, and which might require multiple paths to function. The words series and parallel are used in the layout-diagram sense. The formulation encompasses cases which have been analyzed by complex methods in numerous papers on the reliability of three-state DFM device systems. The effects of dominant failure-modes on the relationship between reliability of a series system and that of a parallel system, and on the relationship between the reliability of a parallel-series system and that of series-parallel system are presented

Keywords

failure analysis; probability; redundancy; reliability theory; 3-state device systems; dominant failure-modes; failed-open devices; failed-short devices; good devices; layout-diagram sense; multiple failures; nondual failure mode devices; parallel-series system; redundant systems; reliability; series-parallel system; simultaneous failures; Art; Current; Design for manufacture; Failure analysis; Logic devices; Mathematical model; Redundancy; Relays; Reliability theory; Wire;

fLanguage

English

Journal_Title

Reliability, IEEE Transactions on

Publisher

ieee

ISSN

0018-9529

Type

jour

DOI

10.1109/24.257833

Filename

257833