DocumentCode :
1014344
Title :
New methods for the measurement of cathode interface impedance
Author :
Frost, H.B.
Author_Institution :
Bell Telephone Labs., Inc., Murray Hill, N. J.
Volume :
6
Issue :
3
fYear :
1959
fDate :
7/1/1959 12:00:00 AM
Firstpage :
315
Lastpage :
321
Abstract :
Two improved methods for the measurement of cathode interface impedance have been developed, and their limitations have been analyzed. One of these, the complementary network method, is an improvement of a technique disclosed at the IRE National Convention in 1952. The other, the shunt admittance bridge, has not been described previously. Both methods allow the measurement of impedance with both small resistance and short time constant, well below the limit, 50 ohms at 0.1 µsec, of most present equipments. With the development of improved cathode alloys, the measurement of interface impedances having short time constants and low resistances has become important to control this parameter in manufacture and to obtain further improvement. For the complementary-network bridge, the theoretical analysis has shown the extreme importance of minimizing stray inductance in the complementary network. When corrections are applied, the complementary-network bridge has good accuracy, with less than one-ohm error at 10 ohms and 0.05 µsec and lower relative errors for higher resistances. The shunt admittance bridge is most satisfactory when tubes with transconductances greater than 10,000 µmho are to be measured. An impedance transformation is used which allows much easier physical realization of the measurement network than in other interface measurement methods. For tubes with transconductances greater than 10,000 µmho, the shunt admittance bridge will provide accurate time constant and resistance data down to 0.02 µsec and 5 ohms.
Keywords :
Admittance; Bridges; Cathodes; Electrical resistance measurement; Electron devices; Electron tubes; Error correction; Frequency; Impedance measurement; Inductance; Testing; Time measurement; Wideband;
fLanguage :
English
Journal_Title :
Electron Devices, IRE Transactions on
Publisher :
ieee
ISSN :
0096-2430
Type :
jour
DOI :
10.1109/T-ED.1959.14554
Filename :
1472597
Link To Document :
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