DocumentCode :
1014468
Title :
Modeling and simulation of coupled transmission line interconnects over a noisy reference plane
Author :
Senthinathan, Ramesh ; Nimmagadda, Srinivas ; Prince, John L. ; Cangellaris, Andreas C.
Author_Institution :
Adv. Packaging Dev. Center, Motorola Inc., Phoenix, AZ, USA
Volume :
16
Issue :
7
fYear :
1993
fDate :
11/1/1993 12:00:00 AM
Firstpage :
705
Lastpage :
713
Abstract :
Limitations in using conventional coupled transmission line simulators to model signal propagation over a noisy reference plane are explained. A distributed lumped element circuit model including reference plane parasitics and associated coupling (to signal conductors) parasitics is developed, and verified using SPICE simulations. Inductance and capacitance per-unit-length [pul] matrix elements are calculated using detailed two-dimensional parasitic extractors, and the partial inductance concept. Results using this model were compared with conventional “isolated” (switching noise isolated) coupled transmission line simulations. Significant differences were found. Package pin placement on the reference plane, and its impact on overall noise characteristics are analyzed
Keywords :
SPICE; electronic engineering computing; packaging; transmission line theory; SPICE simulations; capacitance per-unit-length; coupled transmission line interconnect; distributed lumped element circuit model; inductance per-unit-length; noisy reference plane; package pin placement; partial inductance concept; reference plane parasitics; signal propagation; switching noise isolated; two-dimensional parasitic extractors; Circuit noise; Circuit simulation; Conductors; Coupling circuits; Distributed parameter circuits; Inductance; Integrated circuit interconnections; SPICE; Transmission line matrix methods; Transmission lines;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/33.257863
Filename :
257863
Link To Document :
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