Title :
Diffusion masking and all-diffused germanium n-p-n mesa transistors
Author_Institution :
IBM Corp., Poughkeepsie, N. Y.
fDate :
4/1/1960 12:00:00 AM
Keywords :
Bandwidth; Circuit stability; Cutoff frequency; Diodes; Electrical resistance measurement; Electron tubes; Geometry; Germanium; Gold; Impedance matching; Laboratories; Magnetic fields; Magnetic noise; Noise figure; Pollution measurement; Silicon; Skin; Solid state circuits; Thermal resistance;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1960.14608
